NIST Calibration Services: Spectroradiometric Measurements

Technology Services, Calibration Services, NIST

Optical Radiation Measurements

Spectroradiometric Source Measurements

Technical Contact:
Charles E. Gibson
39010C–39060S
Tel: 301/975–2329
E-mail: charles.gibson@nist.gov

Do not ship instruments or standards to the mailing address listed below. Contact the technical staff for the shipping address.

Mailing Address:
National Institute of Standards and Technology
100 Bureau Drive, Stop 8441
Gaithersburg, MD 20899–8441
Fax: 301/869–5700

Service ID Number	Description of Services	Fee ($)
NIST calibrates and issues a type 30A/T24/13 tungsten strip lamp with a mogul bi–post base.
39010C	Spectral Radiance Standard, Tungsten Strip Lamp (225 nm to 2400 nm) (other spectral ranges are available under 39060S)	13981
NIST calibrates customer supplied integrating sphere sources and maps the source aperture.
39020C	Spectral Radiance Standard, Integrating Sphere Source (300 nm to 1000 nm in 25 nm steps)	7698
39021C	Spectral Radiance Standard, Integrating Sphere Source (300 nm to 2400 nm in 25 nm steps)	10851
NIST calibrates and issues an 1000 W, tungsten quartz–halogen lamp mounted in a medium bi–post base. The calibrations are performed at 50 cm.
39030C	Spectral Irradiance Standard, 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 450 nm)	10203
39031C	Recalibration of 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 450 nm)	7119
39032C	Spectral Irradiance Standard, 1000 W Tungsten Quartz–Halogen Lamp (350 nm to 800 nm)	10203
39033C	Recalibration of 1000 W Tungsten Quartz–Halogen Lamp (350 nm to 800 nm)	7119
39040C	Spectral Irradiance Standard, 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 1600 nm)	12777
39041C	Recalibration of 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 1600 nm)	9694
39045C	Spectral Irradiance Standard, 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 2400 nm)	15059
39046C	Recalibration of 1000 W Tungsten Quartz–Halogen Lamp (250 nm to 2400 nm)	12059
NIST calibrates and issues a 30 W deuterium arc lamp mounted in a medium bi–post base.
39050C	Spectral Irradiance Standard, 30 W Deuterium Lamp (200 nm to 400 nm)	13033
39051C	Recalibration of 30 W Deuterium Lamp (200 nm to 400 nm)	9484
39060S	Special Tests of Radiometric Sources	At Cost

Fees are subject to change without notice.

Requests for the above calibration services are scheduled for completion within 90 days after the receipt of a purchase order and the test device.

Spectroradiometric Source Measurements (39010C–39060S)

The NIST Quality System is based on the International Standard ISO/IEC 17025:1999(E) General requirements for the competence of testing and calibration laboratories.

Spectral Radiance Lamps (39010C)

Tungsten strip lamps (30A/T24/13) are supplied by NIST as standards of spectral radiance. The lamps are calibrated at 34 wavelengths from 225 nm and 2400 nm, using a 0.6 mm wide by 0.8 mm high target area. The radiance temperature ranges from about 2650 K at 225 nm, to 2475 K at 654.6 nm, to 1610 K at 2400 nm

Spectral Radiance Integrating Sphere Sources (39020C–39021C)

Customer supplied integrating sphere sources are calibrated as standards of spectral radiance. The sphere sources are calibrated every 25 nm from 300 nm up to 2400 nm using a 0.6 mm wide by 0.8 mm high target area. The source exit aperture is spatially mapped and the data is included in the Report of Calibration.

Table 7.1 Calibration Uncertainties for Spectroradiometric Source Measurement

Standard	Wavelength (nm)	Typical Values (µW cm^–2 nm^–1 sr^–1)	Relative Expanded Uncertainty (k = 2)(%)
Tungsten strip lamp spectral radiance standard	225	0.55	1.5
	250	3.6	1.3
	350	3.0 x 10²	1.0
	655	1.3 x 10⁴	0.6
	900	2.2 x 10⁴	0.6
	1700	1.1 x 10⁴	0.5
	2400	4.0 x 10³	0.4

Standard	Wavelength (nm)	Typical Values (µW cm^–2 nm^–1 SR^–1)	Relative Expanded Uncertainty (k = 2)(%)
Integrating sphere source spectral radiance standard	300	0.40	1.1
	500	38.0	0.5
	700	120.0	0.4
	900	150.0	0.7
	1600	84.0	1.2
	2400	10.0	3.0

Standard	Wavelength (nm)	Typical Values (µW cm^–2 nm^–1)	Relative Expanded Uncertainty (k = 2)(%)
Tungsten quartz halogen FEL lamp spectral irradiance standard	250	0.02	1.6
	350	0.85	1.1
	655	17.0	0.6
	900	23.0	0.5
	1600	12.0	0.3
	2400	4.0	0.6

Standard	Wavelength (nm)	Typical Values (µW cm^–2 nm^–1)	Relative Expanded Uncertainty (k = 2)(%)
Deuterium arc lamp spectral irradiance standard	200	0.04	5.0
	250	0.03	3.1
	350	0.007	3.1
	400	0.005	3.1

Figure 7.1 Measurement Uncertainty for NIST Spectral Radiance Calibrations

Spectral Irradiance Lamps (39030C–39051C)

Two types of spectral irradiance lamp standards are supplied by NIST. For general applications, tungsten–filament, 1000 W quartz–halogen FEL lamps are calibrated at 31 wavelengths from 250 nm to 2400 nm, or at a reduced set of wavelengths for narrower wavelength ranges. All calibrations are performed at a working distance is 50 cm. For ultraviolet applications, deuterium–arc lamps are calibrated at 21 wavelengths from 200 nm to 400 nm The deuterium lamps are intended primarily for use at wavelengths between 200 nm and 250 nm Although the shape of the spectral distribution of the deuterium lamps is stable over long periods of time, the absolute irradiance varies on the order of 12 % (k = 2). The uncertainty of the absolute irradiance can be reduced by approximately a factor of two by scaling the spectral irradiance of the deuterium lamp to the spectral irradiance of a tungsten–filament quartz–halogen FEL lamp standard over the wavelength range 250 nm to 300 nm, each time the lamp is operated.

Special Tests of Radiometric Sources (39060S)

Spectroradiometric calibrations of integrating sphere, blackbody, and lamp sources are performed in the Facility for Automatic Spectral Calibrations (FASCAL). This instrument has the capability of performing spectral radiance measurements from 200 nm to 2500 nm and measuring radiance temperatures from 1050 K to 2700 K with an adjustable spectral bandwidth down to 0.1 nm. Spectral irradiance measurement capability from 200 nm to 2500 nm at flux levels down to 0.01 µWcm^–2 nm^–1 is also available. For both spectral radiance and irradiance measurements, a wide variety of sources and measurement geometries are possible. Other special tests requiring the capabilities of FASCAL are also performed, depending on the availability of equipment and personnel.

Figure 7.2 Measurement Uncertainty for NIST Spectral Irradiation Calibrations.

References—Spectroradiometric Source Measurements

Realization of the National Institute of Standards and Technology detector–based spectral irradiance scale, H. W. Yoon, C. E. Gibson, and P. Y. Barnes, Applied Optics 41 (28), 5879-5890 (2002).

Long–term Temporal Stability of the National Institute of Standards and Technology Spectral Irradiance Scale Determined with Absolute Filter Radiometers, H. W. Yoon, and C. E. Gibson, Applied Optics 41 (28), 5872-5878 (2002).

Understanding Your Calibration Sources is the Key to Making Accurate Spectroradiometric Measurements, H. W. Yoon, and C. E. Gibson, OE Magazine, 48, (July 2001).

Comparison of the absolute detector–based spectral radiance assignment with the current NIST–assigned spectral radiance of tungsten–strip lamps, H. W. Yoon, and C. E. Gibson, Metrologia 37, 429–432 (2000).

A CCPR international comparison of spectral radiance measurements in the air–ultraviolet, R. P. Lambe, R. D. Saunders, C. E. Gibson, and J. Hollandt, Metrologia 37 (1), 51–54 (2000).

Results of a NIST/VNIIOFI comparison of spectral–radiance measurements, R. D. Saunders, C. E. Gibson, K. D. Meilenz, V. I. Sapritsky, K. A. Sudarev, and B. B. Khlevnoy, Metrologia 3, 449 (1995).

The New International Temperature Scale of 1990 and its Effect on Radiometric, Photometric, and Colorimetric Measurements and Standards, K .D. Mielenz, R. D. Saunders, A. C. Parr, and J. J. Hsia, CIE Proc. 22nd Session Melbourne 1991 no. 91, (1991).

Results of a CCPR Intercomparison of Spectral Irradiance Measurements by National Laboratories, J. H. Walker, R. D. Saunders, J. K. Jackson, and K. D. Mielenz, J. Res. Natl. Inst. Stand. Technol. 96, 647 (1991).

The 1990 NIST Scales of Thermal Radiometry, K. D. Mielenz, R. D. Saunders, A. C. Parr, and J. J. Hsia, J. Res. Natl. Inst. Stand. Technol. 95 (6), 621–629 (1990).

Spectroradiometric Determination of the Freezing Temperature of Gold, K. D. Mielenz, R. D. Saunders and J. Shumaker, J. Res. Natl. Inst. Stand. Technol., 95 (1), 49–67 (Jan.–Feb. 1990).

The International Temperature Scale of 1990 (ITS–90), H. Preston–Thomas, Metrologia 27, 2–310 (1990).

NBS Measurement Services: Spectral Irradiance Calibrations, J. H. Walker, R. D. Saunders, J. K. Jackson, and D. A. McSparron, Natl. Bur. Stand. (U.S.), Spec. Publ. 250–20 (Sept. 1987).

NBS Measurement Services: Spectral Radiance Calibrations, J. H. Walker, R. D. Saunders, and A. T. Hattenburg, Natl. Bur. Stand. (US), Spec. Publ. 250–1 (Jan. 1987).

Spectral irradiance standard for the ultraviolet: the deuterium lamp, R. D. Saunders, W. R. Ott, and J. M. Bridges, Appl. Opt. 17, 593 (1978).

Spectroradiometric Detector Measurements

Technical Contacts:
Jeanne M. Houston
(39071C–39081S)
Tel: 301/975–2327
E-mail: jeanne.houston@nist.gov

Thomas C. Larason
(39080S, 39081S, 39100S)
Tel: 301/975–2334
E-mail: thomas.larason@nist.gov

George Eppeldauer
(39090S)
Tel: 301/975–2338
E-mail: george.eppeldauer@nist.gov

Do not ship instruments or standards to the mailing address listed below. Contact the technical staff for the shipping address.

Mailing Address:
National Institute of Standards and Technology
100 Bureau Drive, Stop 8441
Gaithersburg, MD 20899–8441
Fax: 301/869–5700

Service ID Number	Description of Services	Fee ($)
39071C	UV Silicon Photodiodes	4402
39072C	Recalibration of UV Silicon Photodiodes	3355
39073C	Visible to NIR Silicon Photodiodes	4494
39074C	Recalibration of Visible to NIR Silicon Photodiodes	3355
39075S	Special Tests of NIR Photodiodes	At Cost
39077C	UV to Near–Infrared Silicon Photodiodes (Hamamatsu S2281)	5332
39078C	Recalibration of UV to Near–Infrared Silicon Photodiodes (Hamamatsu S1337–1010BQ or S2281)	4193
39080S	Special Tests of Radiometric Detectors	At Cost
39081S	Special Tests of Photodetector Responsivity Spatial Uniformity	At Cost
39090S	Special Tests of IR Detectors	At Cost
39100S	Special Tests of Irradiance Detectors	At Cost

Fees are subject to change without notice.

This laboratory's quality system is based on the ANSI/NCSL Z540–1–1994 standard and the ISO/IEC Guide 25.

UV Silicon Photodiodes (39071C)

NIST will supply the customer with a UDT Sensors, Inc. model UV100 silicon photodiode characterized in the ultraviolet (UV) spectral region. The UV silicon photodiode includes the measured spectral responsivity [A/W] from 200 nm to 500 nm in 5 nm steps. The 1 cm² photosensitive area of the photodiodes is underfilled for the measurements with a beam of diameter 1.5 mm. The spectral responsivity is measured at radiant power levels of less than 20 µW. The bandpass of the measurement is 3 nm The spatial uniformity of responsivity over the photosensitive area is also measured at 350 nm

Recalibration of UV Silicon Photodiodes (39072C)

Recalibration of UV silicon photodiodes previously supplied by NIST under (39071C) is performed by measuring spectral responsivity from 200 nm to 500 nm

Visible to Near–Infrared (NIR) Silicon Photodiodes (39073C)

NIST will supply the customer with a Hamamatsu model S2281 (previously a Hamamatsu S1337–1010BQ) windowed silicon photodiode characterized in the visible to near–IR spectral region. The spectral responsivity of the photodiode is measured from 350 nm to 1100 nm in 5 nm steps. The 1 cm² photosensitive area is underfilled for the measurements with a beam of diameter 1.1 mm. The spectral responsivity is measured at radiant power levels of less than 1 µW. The bandpass of the measurement is 4 nm The spatial uniformity of responsivity over the photosensitive area is also measured at 500 nm

Recalibration of Visible to Near–Infrared Silicon Photodiodes (39074C)

Recalibration of visible to near–infrared silicon photodiodes previously supplied by NIST under (39073C) is performed by measuring spectral responsivity from 350 nm to 1100 nm The spectral range can be extended to 200 nm for an additional fee (use Test # 39078C).

Special Tests of NIR Photodiodes (39075S)

Special tests of customer–supplied NIR photodiodes are performed by measuring spectral responsivity from 700 nm to 1800 nm A 1.1 mm diameter beam is centered on and underfills the photosensitive area. The spectral responsivity is measured at radiant power levels of less than 1 µW. The bandpass of the measurement is 4 nm Customers should communicate with Thomas Larason to discuss details before submitting a formal request.

UV to Near–Infrared Silicon Photodiodes (39077C)

NIST will supply customers with a Hamamatsu model windowed silicon photodiode characterized in the UV to near–IR spectral region. The spectral responsivity of the photodiode is measured from 200 nm to 1100 nm in 5 nm steps. The 1 cm² photosensitive area of the photodiode is underfilled for the measurements. The spectral responsivity is measured with a beam of diameter 1.5 mm from 200 nm to 400 nm at radiant power levels of less than 20 µW. The bandpass of the measurement is 3 nm From 405 nm to 1100 nm the spectral responsivity is measured with a beam of diameter 1.1 mm in the 400 nm to 1800 nm spectral region at power levels less than 1 µW. The bandpass of the measurement is 4 nm in this spectral region. The spatial uniformity of responsivity over the photosensitive area is also measured at 500 nm

Recalibration of UV to Near–Infrared Silicon Photodiodes (39078C)

Recalibration of silicon photodiodes previously supplied by NIST (under 39077C or 39073C) is performed by measuring spectral responsivity from 200 nm to 1100 nm

Special Tests of Radiometric Detectors (39080S)

Special tests of radiometric detectors generally used in the ultraviolet, visible, and infrared regions of the spectrum can be performed. Detector characteristics that can be determined in this special test include spectral responsivity and quantum efficiency (electrons per photon). For example, detectors responsivity can be measured between 193 nm and 1800 nm at power levels less than 4.0 µW. The relative expanded uncertainty is dependent on the wavelength and the individual item measured. Since special tests of this type are unique, details of the tests should be discussed with Thomas Larason before submitting a formal request.

Special Tests of Photodetector Responsivity Spatial Uniformity (39081S)

Special tests consisting of measuring the relative changes in responsivity across the photosensitive area (spatial uniformity) can be performed for customer–supplied photodetectors. The uniformity is typically measured at a single wavelength in 0.5 mm spatial increments with a beam diameter of 1.5 mm in the 193 nm to 400 nm spectral region at power levels less than 20 µW, and a beam of diameter 1.1 mm in the 400 nm to 1800 nm spectral region at power levels less than 1 µW. Customers should communicate with Thomas Larason to discuss details before submitting a formal request.

Special Tests of IR Detectors (39090S)

Special tests of customer–supplied ambient temperature infrared detectors can be performed in the 2 µm to 20 µm wavelength range. Measurements at longer wavelength are possible, and may be provided to customers having special requirements. The special tests include spectral power and irradiance responsivity and spatial response measurements. The standard configuration uses a 1.3 mm diameter monochromatic beam to underfill the active area of the detector with an ƒ/# between ƒ/4 and ƒ/8. The monochromator output beam is chopped (~ 39 Hz) and has a radiant power ranging from 1 µW at a wavelength of 4 µm to ~ 10 nW at 18 µm. The optical bandpass of the measurement is ~ 1 % of the test wavelength. Customers should contact George Eppeldauer to discuss details before submitting a formal request or to get information on extended measurement capability.

Special Tests of Irradiance Detectors (39100S)

Special tests of irradiance detectors generally used in the ultraviolet, visible, and near–infrared regions of the spectrum can be performed. Irradiance responsivity of detectors can be measured between 193 nm and 1800 nm at power levels less than 200 µW/cm². The spectral irradiance responsivity of a detector can be determined expressed in the unit amperes·mm² per watt [A·mm²/W]. The relative expanded uncertainty is dependent on the wavelength and the individual item measured. Since special tests of this type are unique, details of the tests should be discussed with Thomas Larason before submitting a formal request.

Table 7.2 Detector Measurement Services Uncertainties

**Relative Expanded Uncertainty (k = 2)[%]**
Wavelength [nm]	UV 100 (UV)	S1337 (Visible)	GE (NIR)	InGaAs (NIR)
200	3.8	3.8
250	1.3	1.3
300	1.3	1.3
350	1.8	1.8
400	1.5	1.5
450	0.38	0.24
500	0.38	0.22
550		0.20
600		0.20
650		0.20
700		0.20	0.46	0.38
750		0.22	0.42	0.36
800		0.22	0.68	0.54
850		0.22	0.44	0.44
900		0.22	0.50	0.40
950		2.6	1.2	1.3
1000		1.7	0.9	0.9
1050		2.7	0.9	0.9
1100		4.2	0.52	0.50
1150			0.8	0.8
1200			1.4	1.5
1250			0.9	0.9
1300			0.9	0.9
1350			0.9	0.9
1400			1.2	1.2
1450			0.9	0.9
1500			1.0	1.0
1550			1.1	1.1
1600			1.4	1.3
1650			1.1	1.0
1700			1.7	2.2
1750			2.6	2.7
1800			3.4	4.2

Table 7.3. NIST Spectroradiometric Detector Measurement Services

Service ID No.	Item of Test	Range	Relative Expanded Uncertainty (k = 2)
39071C	UV Silicon Photodiodes (UDT UV 100)	200 nm to 500 nm	0.4 % to 3.8 %
39072C	Retest of UV Silicon Photodiodes	200 nm to 500 nm	0.4 % to 3.8 %
39073C	Visible to NIR Silicon Photodiodes (Hamamatsu S2281)	350 nm to 1100 nm	0.2 % to 4.2 %
39074C	Retest of Visible to NIR Silicon Photodiodes (Hamamatsu S1337–1010BQ or S2281)	350 nm to 1100 nm	0.2 % to 4.2 %
39075S	Special Tests of NIR Photodiodes	700 nm to 1800 nm	0.4 % to 4 % *
39077C	Ultraviolet to Near–Infrared Silicon Photodiodes (Hamamatsu S2281)	200 nm to 1100 nm	0.2 % to 4.2 %
39078C	Retest of Ultraviolet to Near–Infrared Silicon Photodiodes (Hamamatsu S2281)	200 nm to 1100 nm	0.2 % to 4.2 %
39080S	Special Tests of Radiometric Detectors	193 nm to 1800 nm	0.2 % to 5 % *
39081S	Special Tests of Photodetector Responsivity Spatial Uniformity	193 nm to 1800 nm	0.0024 % to 0.05 % *
39090S	Special Tests of IR Detectors	2 µm to 5.4 µm 5.4 µm to 20 µm	~1.5 % to ~5 %
39100S	Special Tests of Irradiance Detectors	193 nm to 1800 nm	4 % to 13 % *

* Depends on photodetector and signal level.

References—Spectroradiometric Detector Measurements

The new ultraviolet responsivity scale based on cryogenic radiometry at Synchroton Ultraviolet Radiation Facility III, P. S. Shaw, T. C. Larason, R. Gupta, S. W. Brown, R. E. Vest, and K. R. Lykke, Review of Scientific Instruments, 72, (5), (May 2001).

Opto–Mechanical and Electric Design of a Tunnel–Trap Si Radiometer, G. Eppeldauer and D. Lynch, J. Res. Natl. Inst. Stand. Technol. 105(6), 813–828 (2000).

Improved Near–Infrared Spectral Responsivity Scale, P. S. Shaw, T. C. Larason, R. Gupta, S. W. Brown and K. R. Lykke, J. Res. Natl. Inst. Stand. Technol. 105(5), 689 (2000).

NIST Measurement Services: Spectroradiometric Detector Measurements: Part I – Ultraviolet Detectors and Part II– Visible to Near–Infrared Detectors, T. C. Larason, S. S. Bruce, and A. C. Parr, Natl. Inst. Stand. Technol. (US), Spec. Publ. 250–41, (1998).

NIST Measurement Services: Spectroradiometric Detector Measurements: Part III – Infrared Detectors, A. L. Migdall and G. Eppeldauer, Natl. Inst. Stand. Technol. (US), Spec. Publ. 250–42, (1998).

National Institute of Standards and Technology high–accuracy cryogenic radiometer, T. R. Gentile, J. M. Houston, J. E. Hardis, C. L. Cromer, and A. C. Parr, Appl. Opt. 35, 1056–1068 (1996).

Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high–accuracy cryogenic radiometer, T. R. Gentile, J. M. Houston, and C. L. Cromer, Appl. Opt. 35, 4392–4403 (1996).

A National Measurement System for Radiometry, Photometry, and Pyrometry Based upon Absolute Detectors, A. C. Parr, Natl. Inst. Stand. Technol. (US), Tech. Note 1421 (1996).

Developing Quality System Documentation Based on ANSI/NCSL Z540–1–1994 — The Optical Technology Division's Effort, S. S. Bruce and T. C. Larason, Natl. Inst. Stand. Technol. (US), Internal Report 5866 (1996).

High Accuracy Measurement of Aperture Area Relative to a Standard Known Aperture, J. B. Fowler and G. Dezsi, J. Res. Natl. Inst. Stand. Technol. 100(3), 277–283, (1995).

Calibration Group, NIST, 100 Bureau Drive, Stop 2300, Gaithersburg, MD 20899-2300
Telephone: 301-975-2092, Fax: 301-869-3548, E-Mail: calibrations@nist.gov

Date created: 06/30/1999
Last updated: 02/02/2006