IBM RTP EMC Test Labs

NVLAP Lab Code: 200200-0

Address and Contact Information:

3039 Cornwallis Road
Department 2D1A
Research Triangle Park, NC 27709-2195
Contact: Mr. William J. Roberts
Phone: 919-254-7598
Fax: 919-254-4472
E-Mail: wjrobert@us.ibm.com
Send E-Mail to Laboratory: IBM RTP EMC Test Labs

NVLAP Accreditation Information

Listed below is the scope of accreditation for this laboratory as of February 10, 2012. For additional information, contact NVLAP at (301) 975-4016.

Send E-Mail to NVLAP at: NVLAP@nist.gov

Electromagnetic Compatibility & Telecommunications

Accreditation Valid From: July 1, 2011 Through: June 30, 2012

Emissions Test Methods

[12/CIS22] IEC/CISPR 22 (1997) & EN 55022 (1998) + A1(2000)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment

[12/CIS22L] EN 55022 (2006) + A1 (2007)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/CIS22a] IEC/CISPR 22 (1993) and EN 55022 (1994)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment, Amendment 1 (1995) and Amendment 2 (1996)

[12/CIS22b] CNS 13438 (1997)
Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/CIS22f] CNS 13438 (2006)
LImits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/EM02a]
IEC 61000-3-2, Edition 2.1 (2001-10), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic compatibility (EMC) Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A)

[12/EM02ii1] EN 61000-3-2:2006 + A1:2009 + A2:2009
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)

[12/EM03b] IEC 61000-3-3, Edition 1.1(2002-03) & EN 61000-3-3, A1(2001)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections

[12/EM03m] EN 61000-3-3, Ed. 2.0 (2008-09)
EMC- Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low- voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection

[12/EM11en] EN 61000-3-11, 1st Ed (2000-08)
EMC - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems -Equipment with rated current <=75A and subject to conditional connection

[12/EM12a] IEC 61000-3-12 (2004) & EN 61000-3-12 (2005)
Electromagnetic Compatibility (EMC) - PART 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current greater than 16 A and less than or equal to 75 A

[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators

[12/FCC15bb] ANSI C63.4 (2009) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators

[12/ICES003] ICES-003 Issue 4 (2004)
Implementation and Interpretation of the Interference-Causing Equipment Standard for Digital Apparatus. (Industry Canada)

[12/T51] AS/NZS CISPR 22 (2002) and AS/NZS 3548 (1997)
Electromagnetic Interference - Limits and Methods of Measurement of Information Technology Equipment

[12/T51b] AS/NZS CISPR 22, 3rd Edition (2006)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/VCCIc] Agreement of VCCI V-3 (2007.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2007.04

[12/VCCIe] Agreement of VCCI V-3 (2009.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2009.04 (radiated disturbance above 1 GHz)

[12/VCCIf] Agreement of VCCI V-3 (2010.04)
Agreement of VCCI Council - Technical Requirements: V-3/2010.04 (including radiated disturbance above 1 GHz)

Immunity Test Methods

[12/CIS24e] IEC/CISPR 24 (1997) and EN 55024 (1998) + A1(2001), A2(2003)
Information technology equipment - Immunity characteristics - Limits and methods of measurement

[12/I01] IEC 61000-4-2, Ed. 1.2 (2001); EN 61000-4-2
Electrostatic Discharge Immunity Test

[12/I02] IEC 61000-4-3, Ed. 2.0 (2002-03); EN 61000-4-3 (2002)
Radiated Radio-Frequency Electromagnetic Field Immunity Test

[12/I03] IEC 61000-4-4(1995), A1(2000), A2(2001); EN 61000-4-4
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test

[12/I04] IEC 61000-4-5, Ed. 1.1 (2001-04); EN 61000-4-5
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

[12/I05] IEC 61000-4-6, Ed. 2.0 (2003-05); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

[12/I06] IEC 61000-4-8, Ed. 1.1 (2001); EN 61000-4-8
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

[12/I07] IEC 61000-4-11, Ed. 1.1 (2001-03); EN 61000-4-11
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

Return to NVLAP Program Listing