WORLD METROLOGY DAY NIST will hold its third annual celebration of World Metrology Day on Wednesday, May 20, 2009. The Metre Convention was signed on 20 May 1875, a date now celebrated as World Metrology Day. The Convention created the International Bureau of Weights and Measures (BIPM) and set the framework for global collaboration in the science of measurement and in its industrial, commercial and societal application. The original aim of the Metre Convention the worldwide uniformity of measurement remains as important today, in 2007, as it was in 1875. Join us in celebrating World Metrology Day a celebration of our core foundation and purpose! The theme for 2009 is Measurements in Commerce: Metrology Underpinning Economic Development. NIST research and measurements provide a significant foundation for measurements in support of our global economy. Presentations will include:
Poster sessions from the NIST laboratories will be held after the speaker session in the Hall of States, along with refreshments. For more information: Dr. Belinda Collins (TS), x4500, belinda.collins@nist.gov.
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