Teradata Corporation EMC Lab
NVLAP Lab Code: 200383-0
Address and Contact Information:
17095 Via del CampoSan Diego, CA 92127-1711
Contact: Mr. John Flavin
Phone: 858-485-3874
Fax: 858-485-3788
E-Mail: john.flavin@teradata.com
Send E-Mail to Laboratory: Teradata Corporation EMC Lab
NVLAP Accreditation Information
Listed below is the scope of accreditation for this laboratory as of February 10, 2012. For additional information, contact NVLAP at (301) 975-4016.Send E-Mail to NVLAP at: NVLAP@nist.gov
Electromagnetic Compatibility & Telecommunications
Accreditation Valid From: January 1, 2012 Through: December 31, 2012
- Emissions Test Methods
[12/61000g] EN 61000-6-3 (2007)
Electromagnetic compatibility (EMC) - Part 6-3: Generic standard - Emission standard for residential, commericial and light industrial environments
[12/CIS11h1] AS/NZS CISPR 22:2006
Information technology equipment-Radio disturbance characteristics-Limits and methods of measurement
[12/CIS22] IEC/CISPR 22 (1997) & EN 55022 (1998) + A1(2000)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment
[12/CIS22L] EN 55022 (2006) + A1 (2007)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
[12/CIS22a] IEC/CISPR 22 (1993) and EN 55022 (1994)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment, Amendment 1 (1995) and Amendment 2 (1996)
[12/CIS22b] CNS 13438 (1997)
Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment
[12/CIS22c] IEC/CISPR 22, Fourth Edition (2003-04) & EN 55022 (1998)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
[12/CIS22c3] IEC/CISPR 22, Edition 5 (2005) + A1(2005)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
[12/CIS22e] IEC/CISPR 22 (2002) and EN 55022 (1998)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment
[12/CIS22f] CNS 13438 (2006) (up to 6GHz)
LImits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment
[12/CIS22k] IEC/CISPR 22 (2008-09)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment
[12/EM02a]
IEC 61000-3-2, Edition 2.1 (2001-10), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic compatibility (EMC) Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A)
[12/EM02i] IEC 61000-3-2, Ed. 3.0 (2005-11)
Electromagnetic compatability (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)
[12/EM02ii] IEC 61000-3-2, Ed. 3.0 (2005) +A1 (2008) +A2 (2009)
Electromagnetic compatability (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)
[12/EM02ii1] EN 61000-3-2:2006 + A1:2009 + A2:2009
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)
[12/EM02j] EN 61000-3-2 (2006)
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current up to and including 16 A per phase)
[12/EM03] IEC 61000-3-3(1995); EN 61000-3-3(1995); AS/NZS 2279.3(1995)
EMC - Part 3: Limits - Section 3. Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current up to 16A
[12/EM03c1] IEC 61000-3-3 (1994) with A1 (2001), A2 (2005)
Electromagnetic compatibility - Limits - Limitations of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems for equipment with rated current <= 16 A per phase and not subject to conditional connections
[12/EM03h] IEC/EN 61000-3-3 (1995) + A1 (2001) + A2 (2005)
Conducted Emissions, Voltage Flicker
[12/EM03m] EN 61000-3-3, Ed. 2.0 (2008-09)
EMC- Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low- voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
[12/EM03n] IEC 61000-3-3 Ed. 2.0 (2008)
EMC- Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current =16 A per phase and not subject to conditional connection
[12/EM11] IEC 61000-3-11, 1st edition (2000-08)
EMC - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems -Equipment with rated current <=75A and subject to conditional connection
[12/EM11en] EN 61000-3-11, 1st Ed (2000-08)
EMC - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems -Equipment with rated current <=75A and subject to conditional connection
[12/EM12] IEC 61000-3-12, Rev 04, November 2004
Electromagnetic Compatibility (EMC) - PART 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current greater than 16 A and less than or equal to 75 A
[12/EM12a] IEC 61000-3-12 (2004) & EN 61000-3-12 (2005)
Electromagnetic Compatibility (EMC) - PART 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current greater than 16 A and less than or equal to 75 A
[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators
[12/T51a] AS/NZS CISPR 22 (2004)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
[12/TCVN] TCVN 7189:2002 (CISPR 22:1997)
Information Technology Equipment-Radio disturbance characteristics-Limits and methods of measurement
[12/VCCIee] Agreement of VCCI V-3 (2009.04) (up to 1GHz)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2009.04 (radiated disturbance up to 1GHz)
[12/VCCIff] Agreement of VCCI V-3 (2010.04) (up to 1GHz)
Agreement of VCCI Council - Technical Requirements: V-3/2010.04 (radiated disturbance up to 1 GHz)
[12/VCCIg] Agreement of VCCI V-3 (2011.04)
Agreement of VCCI Council - Technical Requirements: V-3/2011.04 (including radiated disturbance above 1 GHz)
- Immunity Test Methods
[12/610006j] EN 61000-6-2 (2005)
Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity for industrial environments
[12/CIS24a] EN 55024 and CISPR 24 (1997, modified)
Information technology equipment - Immunity characteristics - Limits and methods of measurements
[12/I01] IEC 61000-4-2, Ed. 1.2 (2001); EN 61000-4-2
Electrostatic Discharge Immunity Test
[12/I01a] IEC 61000-4-2 (1995), A1(1998), A2(2000); EN 61000-4-2(1995)
ESD Immunity Test
[12/I01e] IEC 61000-4-2 (1995)
ESD Immunity Test
[12/I02] IEC 61000-4-3, Ed. 2.0 (2002-03); EN 61000-4-3 (2002)
Radiated Radio-Frequency Electromagnetic Field Immunity Test
[12/I02j] IEC 61000-4-3 (1996)
Radiated, radio-frequency, electromagnetic field immunity test
[12/I03] IEC 61000-4-4(1995), A1(2000), A2(2001); EN 61000-4-4
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test
[12/I03f] IEC 61000-4-4 (1995)
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test
[12/I04] IEC 61000-4-5, Ed. 1.1 (2001-04); EN 61000-4-5
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
[12/I04a] IEC 61000-4-5(1995),A1(2000); EN 61000-4-5(1995),A1(2001)
Surge Immunity Test
[12/I05] IEC 61000-4-6, Ed. 2.0 (2003-05); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
[12/I05a] IEC 61000-4-6 (1996),A1(2000); EN 61000-4-6(1996),A1(2001)
Immunity to Conducted Disturbances, Induced by Radio Frequency Fields
[12/I05i] IEC 61000-4-6 (1996)
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
[12/I06] IEC 61000-4-8, Ed. 1.1 (2001); EN 61000-4-8
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
[12/I06a] IEC 61000-4-8(1993), A1(2000); EN 61000-4-8(1994), A1(2000)
Power Frequency Magnetic Field Immunity Test
[12/I06d] IEC 61000-4-8 (1993)
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
[12/I07] IEC 61000-4-11, Ed. 1.1 (2001-03); EN 61000-4-11
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests
[12/I07a] IEC 61000-4-11(1994),A1(2001) & EN 61000-4-11(1994),A1(2001)
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests
[12/I07h] IEC 61000-4-11 (1994)
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests
- Product Safety Test Methods
[12/950X03] IEC/EN 60950-1 Test Method Inclusion List
Marking durability, protection against access, heating, humidity resistance, distance through insulation, thermal, leakage current, dielectric withstand, and mechanical strength. Clauses 6 and 7 are excluded (telephone network connection).
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