Electromagnetic Measurements Rate our Services Technical Contacts:
Randolph E. Elmquist
Tel: 301/975-6591
E-mail: randolph.elmquist@nist.gov Marlin E. Kraft
Tel: 301/975-4239
E-mail: marlin.kraft@nist.gov Denise D. Prather
Administration and Logistics
Tel: 301/975-4221
E-mail: denise.prather@nist.gov Please contact the administration and logistics staff before shipping instruments or standards to the address listed below. Mailing Address :
National Institute of Standards and Technology
100 Bureau Drive, Stop 8170
Gaithersburg, MD 20899-8170
Calibration fees are the most critical element in funding the metrology services that we provide, and represent the direct cost of providing calibration services for dc resistors and shunts. These services often reach beyond traceability to include detailed consultation. Currently our fees also must recover some of the rapidly increasing costs of providing year-round, readily accessible services and maintaining state-of-the-art traceability through the quantum Hall effect standard. Customers of our most critical calibration services, NIST Service ID numbers 51130C and 51131C, have benefited the most from our efforts to reduce turn-around time through automation, and to provide the world's best level of uncertainty, while keeping these test fees at a reasonable level. In fiscal year 2009, these fees will increase substantially. This necessary fee increase will enable continued support of the most fundamental metrology needs of the users of these services.
Service ID
Number | Description of Services | Fee ($) | | 51100S | Special Resistance Measurement Services, by Prearrangement | At Cost | | 51110M | Measurement Assurance Program for Resistance | At Cost | | 51130C | Standard Resistor, Thomas-Type, 1  | 3308 | | 51131C | Standard Resistor, Evanohm Wirewound High Precision, 10 k | 3237 | | 51132C | Standard Resistor, Four-Terminal 0.0001 | 2401 | | 51133C | Standard Resistor, Four-Terminal 0.001 | 2062 | | 51134C | Standard Resistor, Four-Terminal 0.01 | 2062 | | 51135C | Standard Resistor, Four-Terminal 0.1 | 1557 | | 51136C | Standard Resistor, Four-Terminal 1 | 1557 | | 51137C | Standard Resistor, Four-Terminal 10 | 1557 | | 51138C | Standard Resistor, Four-Terminal 100 | 1557 | | 51139C | Standard Resistor, Four-Terminal 1 k | 1557 | | 51140C | Standard Resistor, 10 k | 1986 | | 51141C | Standard Resistor, 100 k | 1986 | | 51142C | Standard Resistor, 1 M | 2202 | | 51143C | Standard Resistor, 10 M | 2494 | | 51144C | Additional Voltage, 10 M | 2049 | | 51145C | Standard Resistor, 100 M | 2494 | | 51146C | Additional Voltage, 100 M | 2049 | | 51147C | Standard Resistor, 1 G | 2494 | | 51148C | Additional Voltage, 1 G | 2049 | | 51149C | Standard Resistor, 10 G | 3169 | | 51150C | Additional Voltage, 10 G | 2725 | | 51151C | Standard Resistor, 100 G | 3169 | | 51152C | Additional Voltage, 100 G | 2725 | | 51153C | Standard Resistor, 1 T | 3338 | | 51154C | Additional Voltage, 1 T | 2895 | | 51160C | Standard Resistor for Current Measurements (Shunts) with All Determinations at 400 A or Below, One Range, One Current Level | 3080 | | 51161C | Standard Resistor for Current Measurements (Shunts) with At Least One Determination Above 400 A (maximum current 2000 A), One Range, One Current Level | 4431 | | 51162C | Standard Resistor for Current Measurements (Shunts), Additional Range of a Multi-Range Resistor | 1893 | | 51163C | Standard Resistor for Current Measurements (Shunts), Additional Determination at Another Current Level | 1893 | Fees are subject to change without notice. back to top of page | back to index of electromagnetic measurements Testing or evaluation of prototype resistance standards or measuring instruments; unique resistance measurements; and other calibration services not specified below, such as the determination of the pressure coefficient of Thomas-type or 10 k resistors, the determination of the temperature coefficient of standard resistors, and the calibration of resistance standards in oil at temperatures other than 25 °C, are carried out under this Service ID number. Such measurements are made at the discretion of the NIST technical staff in a manner specifically agreed upon by the customer and the expert involved. Testing of component resistors will only be considered under the rare circumstance that the behavior of the resistors has been observed to approximate that of state-of-the-art standards under the same conditions. back to top of page | back to index of electromagnetic measurements Resistance MAP transfers are generally carried out at the 1 and 10 k levels. Four well-characterized commercial standard resistors are used as transport standards at each level. The suggested measurement schedule at the client laboratory consists of measurements on each transport resistor three times a week for a period of 4 to 6 weeks, depending upon the settling time of the resistors due to transportation effects. Participation in this program is generally not advisable unless one is required to support resistance measurements with state-of-the-art or near state-of-the-art uncertainties and is willing to adopt a system for the continuous surveillance of standards during the intervals between NIST MAP transfers. A successful transfer requires a considerable amount of data collection and a willingness to become involved in the data analysis process. Data supplied in the course of routine NIST calibrations suffice for normal measurement requirements of standards laboratories if proper methods are used by the laboratory to quantify the additional uncertainties caused by transportation and the laboratory's own measurement process. back to top of page | back to index of electromagnetic measurements Thomas-type 1 resistors or their equivalent are calibrated directly against the NIST 1 reference group that is used to maintain the U.S. legal ohm. The values of the reference group are known in terms of the quantum Hall effect. Special 10 k standard resistors designed for air or oil use are calibrated directly against the NIST 10 k working standards. The special 10 k standard resistors (Evanohm wirewound high-precision or equivalent) are characterized by resistance corrections within 10 x 10-6 of nominal value, temperature coefficients of ± 1 x 10-6 /°C at the operating temperature, and drift rates of < 1 x 10-6/year. The customer's resistors are acclimatized in their respective test environments for approximately 1 week prior to their calibration. Measurement parameters of temperature and current level are shown in Table 9.1 . Table 9.1 . Temperatures and Current Levels for Customer's Resistors | Resistor | Medium | Temperature
(°C) | Current
(mA) | | 1 | oil | 25.000 ± 0.003 | 100 | | 10 k | oil | 25.00 ± 0.01 | 1 | | 10 k | air | 23.0 ± 1.0 | 1 | The temperature of the customer's resistor at the time of the measurement is given in the report of calibration. Since some of these resistors exhibit a significant pressure coefficient, the barometric pressure at the time of the measurement is also reported. Uncertainties are based upon (1) the random behavior of the measurement process as characterized by data from a large population of individual calibrations, and (2) an estimate of the systematic errors arising from such sources as temperature inaccuracies, pressure inaccuracies, scaling errors, etc. Uncertainties are listed in Table 9.2 .
back to top of page | back to index of electromagnetic measurements Table 9.2 . Calibration Uncertainties for Low-power DC Resistance Standards
Note: Resistance uncertainties were changed effective March 8, 2004. See NIST Technical Note 1458 . Service ID
No. | Resistance
( ) | Terminal
Connection | Power
(mW) | Relative
Uncertainty U
(x 10-6) | | 51130C | 1 (Thomas) | 4 | 10 | 0.04 | | 51131C | 104 (Special) | 5 | 10 | 0.08 | | 51132C | 10-4 | 4 | 10 | 4 | | 51133C | 10-3 | 4 | 10 | 1.2 | | 51134C | 10-2 | 4 | 10 | 0.8 | | 51135C | 10-1 | 4 | 10 | 0.5 | | 51136C | 1 | 4 | 10 | 0.3 | | 51137C | 10 | 4 | 10 | 0.3 | | 51138C | 102 | 4 | 10 | 0.2 | | 51139C | 103 | 4 | 10 | 0.2 | | 51140C | 104 | 4 | 10 | 0.2 | | 51141C | 105 | 2 | 10 | 0.8 | | 51142C | 106 | 2 | 10 | 0.8 | | 51143C-51144C | 107 | 3 | * | 3 to 8 | | 51145C-51146C | 108 | 3 | * | 5 to 12 | | 51147C-51148C | 109 | 3 | * | 10 to 25 | | 51149C-51150C | 1010 | 3 | * | 20 to 50 | | 51151C-51152C | 1011 | 3 | * | 50 to 120 | | 51153C-51154C | 1012 | 3 | * | 100 to 250 | | 51132C-51142C: At the levels of accuracy involved, four-terminal measurements are required for resistors whose nominal values are 10 000 or less. | | * Resistors at this level are tested at customer-specific voltages up to 500 V for resistors below 1010 and 1000 V for resistors at or above 1010 . The relative uncertainty depends on the design of the resistor, see NIST Measurement Services for DC Standard Resistors for more information. | back to top of page | back to index of electromagnetic measurements Standard resistors with nominal decade values in the range between 10-4 and 106 are calibrated by comparison with NIST working standards of equivalent value, known in terms of the Quantum Hall effect. In general, these standards are characterized by (1) resistance corrections within 500 x 10-6 of nominal value, (2) temperature coefficients of < 10 x 10-6 /°C at the temperature of use, and (3) drift rates of < 5 x 10-6/year. Normally, standard resistors are measured in an oil bath maintained at (25.0 ± 0.01) °C, and at a power level of < 0.1 W. Resistors in temperature-controlled enclosures with fixed terminations are also accepted for calibration. At the levels of accuracy involved, four-terminal measurements are required for resistors whose nominal values are 100 or less. Expanded uncertainties are based upon (1) the random behavior of the measurement process as characterized by data from a large population of individual calibrations, and (2) an estimate of the systematic errors. Uncertainties are given in Table 9.2 . back to top of page | back to index of electromagnetic measurements High-value standard resistors in the range between 107 and 1012 are calibrated in an air bath maintained at a temperature of (23.0 ± 0.1) °C and at a relative humidity of (35 ± 5)%. The resistors are maintained at these conditions at least 24 hours prior to testing. Customer resistors are compared 1:1 with NIST working standards of the same nominal value up to and including the 1012 level. The maximum test voltage is 500 V for resistors < 1010 and 1000 V for resistors > 1010 . Uncertainties depend upon the stability and performance of the specific resistor involved and are given in Table 9.2 . Only resistors that are mounted in a shielded enclosure with a permanent identifying number and have suitable terminations are accepted for calibration. The resistance of thin-film, high-valued resistance standards is frequently highly voltage dependent. Hence, the magnitude of the test voltage should be specified by the customer when a resistor is submitted for calibration. The temperature, relative humidity, and test voltage of the resistor are given in the report of calibration. Special, hermetically sealed high-resistance standards can be calibrated at lower uncertainties than unsealed thin-film resistors. Please refer to NIST Technical Note 1458 for details. back to top of page | back to index of electromagnetic measurements Arrangements should be made with NIST staff prior to submitting a current shunt for calibration at a current level above 400 A. The maximum test current available is 2000 A. The uncertainty of measurement depends largely upon the performance of the customer's resistor involved. Normally only resistors of 0.04% relative uncertainty or less are calibrated. Please refer to NIST Technical Note 1458 for details. back to top of page | back to index of electromagnetic measurements
References-DC Resistance NIST Measurement Services for DC Standard Resistors , R. E. Elmquist, D. G. Jarrett, G. R. Jones, Jr., M. E. Kraft, S. H. Shields and R. F. Dziuba, Natl. Inst. Stand. Technol. Tech. Note 1458 (Dec. 2003).
Measurement Techniques of Low-Value High-Current Single-Range Shunts from 15 Amps to 3000 Amps, M. Kraft, NCSLI Measure, 2 (1) 44-49, (March 2007). Temperature and Pressure Coefficients for Thomas 1 Resistors, G. R. Jones and R. E. Elmquist, NCLSI Measure, 2 (2) 42-48, (June 2007). Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM, F. Delahaye, T. J. Witt, R. E. Elmquist, and R. F. Dziuba, Metrologia, 37, 173-176 (2000). Automated Guarded Bridge for Calibration of Multi-Megohm Standard Resistors from 10 M to 1T , D. G. Jarrett, IEEE Trans. Instrum. Meas., 46 (2), 325-328 (April 1997). Guidelines for Implementing the New Representation of the Volt and Ohm Effective January 1, 1990 , N. B. Belecki, R. F. Dziuba, B. F. Field, and B. N. Taylor, Natl. Inst. Stand. Technol. Tech. Note 1263 (June 1989). New Realization of the Ohm and Farad Using the NBS Calculable Capacitor , J. Q. Shields, R. F. Dziuba, and H. P. Layer, Conf. Precision Electromagnetic Meas. (CPEM '88), June 7-10,1988, Tsukuba Science City, Japan, Special Issue CPEM '88 IEEE Trans. Instrum. Meas. 38 (2), 249-251 (April 1989). Determination of the Time-Dependence of NBS Using the Quantized Hall Resistance , M. E. Cage, R. F. Dziuba, C. T. Van Degrift, and D. Yu, Conf. Precision Electromagnetic Meas. (CPEM '88), June 7-10, 1988. Tsukuba Science City, Japan, Special Issue CPEM '88 IEEE Trans. Instrum. Meas. 38 (2), 263-269 (April 1989). Monitoring the U.S. Legal Unit of Resistance via the Quantum Hall Effect, M. E. Cage, R. F. Dziuba, B. F. Field, T. E. Kiess, and C. T. Van Degrift, IEEE Trans. Instrum. Meas. IM-36, 222 (June 1987). The NBS Ohm Past-Present-Future , R. F. Dziuba, Proc. Meas. Science Conf., Irvine, CA (Jan. 1987). A Test of the Quantum Hall Effect as a Resistance Standard , M. E. Cage, R. F. Dziuba, and B. F. Field, IEEE Trans. Instrum. Meas. IM-34, 301 (1985). Automated NBS 1-Ohm Measurement System, K. R. Baker and R. F. Dziuba, IEEE Trans. Instrum. Meas. IM-32, 154 (1982). An Integrated System for the Precision Calibration of Four-Terminal Standard Resistors , T. E. Wells and E. F. Gard, IEEE Trans. Instrum. Meas. IM-20, 253 (Nov. 1971). Calibration Procedures for Direct Current Apparatus , P. Brooks, Natl. Bur. Stand. (U.S.), Monogr. 39 (Mar. 1962). Measurement of Multimegohm Resistors , A. H. Scott, J. Res. Natl. Bur. Stand. (U.S.), 50, (3) (Mar. 1953). Precision Resistors and Their Measurement , J. L. Thomas, Natl. Bur. Stand. (U.S.), Circular 470 (Oct. 1948). Methods, Apparatus, and Procedures for the Comparison of Precision Standard Resistors , F. Wenner, J. Res. Natl. Bur. Stand. (U.S.), 25, 229, Res. Paper RP1323 (Aug. 1940). back to top of page | back to index of electromagnetic measurements
Rate our Services Technical Contact:
Gerald J. FitzPatrick
Tel: 301/975-8922
E-mail: gerald.fitzpatrick@nist.gov Denise D. Prather
Administration and Logistics
Tel: 301/975-4221
E-mail: denise.prather@nist.gov Please contact the administration and logistics staff before shipping instruments or standards to the address listed below. Mailing Address:
National Institute of Standards and Technology
100 Bureau Drive, Stop 8170
Gaithersburg, MD 20899-8170 Service ID
Number | Description of Services | Fee ($) | | 51210C | High-Voltage Standard Resistors | At Cost | Fees are subject to change without notice. back to top of page | back to index of electromagnetic measurements A routine calibration service is maintained for resistors designed for dc high-voltage applications. This service is for corona-free resistors designed for dc operation between 10 kV and 150 kV. Resistors may be hand-carried or shipped to NIST. If they are shipped, they should be packaged in sturdy reusable containers with convenient access to the resistor. The design of many high-voltage resistors makes them vulnerable to shear-type forces, so provisions should be made to minimize the likelihood of damage due to such forces when the device is in the shipping container. Users of this service should first discuss scheduling of calibrations with a NIST technical contact. The purchase order should indicate the voltage test points, a mailing address for the calibration report, and a shipping address for the resistor. back to top of page | back to index of electromagnetic measurements
References-High-Voltage Standard Resistors High-Voltage Divider and Resistor Calibrations , M. Misakian, Natl. Bur. Stand. (U.S.), Tech. Note 1215 (July 1985). Special Shielded Resistor for High-Voltage Measurements , J. H. Park, J. Res. Natl. Bur. Stand. 66C (1), 1924 (Jan.-Mar. 1962). back to top of page | back to index of electromagnetic measurements Date created: 06/30/1999
Last updated: 08/18/2009 |
and 10 k